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椭偏仪在位表征电化学沉积的系统搭建(二十四)- 全波段沉积过程的准在位测试分析-不同时间所测试的光学

发布时间:2024-05-06 15:40:11 浏览量:123 作者:Alex

摘要

依据实验组前期对CU2O薄膜沉积的实验,选择-0.4mA进行两电极的恒流沉积,并用椭偏仪进行在位监测,每沉积180s后进行300nm到800nm的椭偏测试。即在沉积180s、360s、540s、720s、900s、1080s后分别进行了椭偏仪全谱测试,测试角度为70°。

正文


椭偏仪在位表征电化学沉积的系统搭建(二十四)- 全波段沉积过程的准在位测试分析-不同时间所测试的光学常数


不同时间所测试的光学常数(n,k)


从图4-6(a,c)中看,随着时间的变化,光学常数n值发生变化。当沉积时间为180s的时候,在500-800nm的长波范围,其值从衬底(0s)时接近0增加到1.3,这也意味着新的物质增加,导致衬底的信息减少。在沉积时间增加到360s时,在410nm附近处现一个较明显的波包,同时在500-800nm区域出现一个波包,大约在700nm附近。当沉积时间增加到540s之后,n的值恢复到沉积180s附近。可以看出随着沉积的变化,沉积的CU2O导致n值在360s的时候有额外的峰出现。


图4-6(b,d)中显示吸收系数k值随着时间的变化,与反射率R的趋势一致。在所测波长范围内的k值在沉积过程都有所降低,特别是在长波500-800nm的范围内zui为明显。当沉积时间为180s的时候,k的值大约从4.3降到1.5,在波长为300-500nm之间存在两个波包(330nm,400nm)。当沉积时间增加到360s时,在短波300-500nm的波包变得较明显(330nm,380nm),整体的k值都有所增加。当沉积时间增加到540s时,k的值大小恢复到沉积180s时,但是在500-800nm范围出现两个波包(510nm,670nm)。到720s的时候,在500-800nm范围只有一个大的波包,并且k值较大。到900s和1080s时,在500-800nm范围时,又出现两个波包但是峰位有所变化。因此同样的,k值显示在360s比其它沉积时间有较大的吸收值。由于随着沉积时间的增加,所沉积的物质的物相可能发生变化以及厚度和表面粗糙度的变化。


新的物相会同时影响到折射率n和消光系数k,在图4-6(b,d)吸收系数中观察到在长波范围内(500-800nm)的波包变化但是在图4-6(a,c)中的折射率系数n却没有监测到,这意味着这个吸收系数的波包变化可能是沉积材料的厚度导致的。对于沉积时间为360s时,相对于其它沉积时间n值和k值都有很大的变化,这可能是360s时的物相较为特殊。由于物相包括新物质或者是结构,如颗粒尺寸,所以这可能是由于在360s时沉积的CU2O成分或者是此时得到的颗粒尺寸或者结构有所不同,需要进一步验证。


图4-6不同沉积时间得到的椭偏数据图(a,c)n,(b,d)k


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